In semiconductor manufacturing, especially in electrical test data, but also in other parameters, there are often sets of parameters that are very highly correlated. Even a change in the correlation ...

Understanding how structural defects affect the optoelectronic performance of silicon semiconductor wafers is critical for improving device efficiency and reliability. Simultaneous Raman and ...

We adapt a semi-Bayesian hierarchical modeling framework to jointly characterize the space–time variability of seasonal precipitation totals and precipitation extremes across the Northern Great Plains ...

A novel workflow combining comprehensive two-dimensional gas chromatography (GC×GC) with computer vision (CV) was developed to analyze the complex volatile profiles of coffee. By generating composite ...